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Cross-Sectional Specimen Preparation for TEM
A specific technique for the cross-sectional specimen preparation for transmission electron microscopy (TEM) has been developed during the recent years, mainly applied to thin film stacks of solar-cell devices.
Peter schubert bischoff
Ulrike bloeck
Gatan inc
Gatan inc nov
Hahn meitner institute
Helmholtz center
Image credit
Thin solid films
Specimen preparation
Daniel abou ras
Cross sectional specimen preparation
Transmission electron microscopy
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