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Cross-Sectional Specimen Preparation for TEM

A specific technique for the cross-sectional specimen preparation for transmission electron microscopy (TEM) has been developed during the recent years, mainly applied to thin film stacks of solar-cell devices.

Peter schubert bischoffUlrike bloeckGatan incGatan inc novHahn meitner instituteHelmholtz centerImage creditThin solid filmsSpecimen preparationDaniel abou rasCross sectional specimen preparationTransmission electron microscopy

Weldaloy Specialty Forgings Promotes World-Renowned Metallurgical Engineer

Weldaloy Specialty Forgings Promotes World-Renowned Metallurgical Engineer
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United statesUttar pradeshAndhra pradeshRamachandra canumallaAndrew smithMaterials technologyExchange scientistHahn meitner institute for nuclear researchNational institute of technology warangalTechnology at weldaloyIndian institute of technology bombayTechnology officerIndian institute of technology banaras hindu universityMinistry of steelSpecialty forgingsVice president