A specific technique for the cross-sectional specimen preparation for transmission electron microscopy (TEM) has been developed during the recent years, mainly applied to thin film stacks of solar-cell devices.

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Germany , Berlin , Peter Schubert Bischoff , Ulrike Bloeck , Gatan Inc , Gatan Inc Nov , Hahn Meitner Institute , Helmholtz Center , Image Credit , Thin Solid Films , Specimen Preparation , Daniel Abou Ras , Cross Sectional Specimen Preparation , Transmission Electron Microscopy , Em ,