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Cross-Sectional Specimen Preparation for TEM
A specific technique for the cross-sectional specimen preparation for transmission electron microscopy (TEM) has been developed during the recent years, mainly applied to thin film stacks of solar-cell devices.
Germany
Berlin
Peter-schubert-bischoff
Ulrike-bloeck
Gatan-inc
Gatan-inc-nov
Hahn-meitner-institute
Helmholtz-center
Image-credit
Thin-solid-films
Specimen-preparation
Daniel-abou-ras
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