X-ray photoelectron spectroscopy (XPS) has become an indispensable characterization technique for analyzing the surface chemistry of thin films and coatings. With its ability to probe just the top few nanometers and reveal elemental composition, chemical bonding, and electronic structure, XPS provides unparalleled insights into how surface and interface properties determine film performance.
Researchers grow high quality superconductor, find resilience against magnetic fields phys.org - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from phys.org Daily Mail and Mail on Sunday newspapers.
Compatibility with a diverse range of material types has made atomic force microscopy a very popular technique in materials science. Recently, atomic force microscopy has become increasingly popular for geological characterization applications.