X-ray photoelectron spectroscopy (XPS) has become an indispensable characterization technique for analyzing the surface chemistry of thin films and coatings. With its ability to probe just the top few nanometers and reveal elemental composition, chemical bonding, and electronic structure, XPS provides unparalleled insights into how surface and interface properties determine film performance.
This article presents an overview of laser diffraction, its application in measuring particle size distributions, and its diverse uses across various industries.
Atomic force microscopy (AFM) has become an essential characterization tool in polymer research due to its unique capacity for multifunctional, nanoscale imaging and measurement. Recent advances have enabled AFM to probe complex polymer structures, functions, and behavior under real-world conditions across various scales.
This article summarizes the Vision 2050 report and examines how the framework empowers businesses to lead global transformations, addressing pressing issues such as climate change, inequality, and environmental degradation.