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Enhancing Transmission Electron Microscopy (TEM) with ClearView

In this interview, Fernando C. Castro, Ph.D., an Applications Scientist at Gatan, talks to AZoMaterials about the versatile applications of Electron Backscatter Diffraction (EBSD) in materials science and metallurgy.

Fernandoc-castro
Dapplications-scientistgatan
Fernando-castro
Gatan-inc-nov
Gatan-inc
University-of-chicago
Northwestern-university
From-gatan
Inc-nov
Applications-scientist
Frame-control
Frame-control-mode

Electron Backscatter Diffraction (EBSD) in Materials Science

In this interview, Dr. Stuart Wright, a Senior Scientist at Gatan/EDAX, talks to AZoMaterials about the versatile applications of Electron Backscatter Diffraction (EBSD) in materials science and metallurgy.

United-states
America
Stuart-wright
Stuart-wrightsenior-scientistgatan
Brent-adams
Los-alamos
Brigham-young-university
Los-alamos-national-lab
Yale-university
Ametek
Gatan-inc-nov
Gatan-inc

Cross-Sectional Specimen Preparation for TEM

A specific technique for the cross-sectional specimen preparation for transmission electron microscopy (TEM) has been developed during the recent years, mainly applied to thin film stacks of solar-cell devices.

Germany
Berlin
Peter-schubert-bischoff
Ulrike-bloeck
Gatan-inc
Gatan-inc-nov
Hahn-meitner-institute
Helmholtz-center
Image-credit
Thin-solid-films
Specimen-preparation
Daniel-abou-ras

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