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Characterizing Microlenses via White Light Interferometry

Because of their ever-increasing use in a variety of applications, microlenses and their design are constantly being improved to reduce distortion, astigmatism, or other problems that can impede observation. In this article, Bruker explains how white light interferometry can be used to characterize microlenses.

Roger posustaBruker surevisionLouis castelBruker nanoBruker nano surfacesTip tiltMultiple regionImage creditZernike generationSubtract asphereSamuel leskoWhite light interferometry

Who Is Shaping The Direction Of Metrology

Who Is Shaping The Direction Of Metrology
photonicsonline.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from photonicsonline.com Daily Mail and Mail on Sunday newspapers.

Samuel leskoUs chips rd metrology programSemiconductor engineeringInternational bureau of weightsSemiconductor ecosystemInternational organization of legal metrologyNational institute of standardsInternational cooperationJohn onceaScience actBruker nano surfacesNational instituteDevelopment supportInternational bureauInternational organizationLegal metrology

Bruker Introduces Next-Generation 3D Areal Surface Measurement Technology for Production and Research Environments

At the SPIE Photonics West 2023 Exhibition, Bruker Corporation today announced the release of two new white-light interferometry (WLI) systems: the ContourX-1000 and NPFLEX-1000 optical profilometers.

United statesLouis castelDon cohenSamuel leskoBruker nano surfacesfebBruker corporationFrom bruker nano surfacesfebAdvanced find surfaceSenior directorGeneral managerOptical metrologyImage creditBruker nanoUniversal scanning interferometry

Quality Control in Surface Metrology Through Software Integration

In this article, Digital Surf discusses how their partnership with Bruker has led to the development of a fully integrated surface metrology quality control analysis solution.

Alex smithSamuel leskoSoftware analysisDigital surfjunSurface metrology through softwareImage creditChallenges associatedStatistical process controlMeasurement automationDigital surfSurface metrologyQuality control

Using Optical Profiling to Optimize Finishing Steps in Additive Manufacturing | Webinars

Using Optical Profiling to Optimize Finishing Steps in Additive Manufacturing | Webinars
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France generalSamuel leskoUniversity of burgundyUsing optical profilingOptimize finishing stepsAdditive manufacturingwed