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Bruker Introduces Next-Generation 3D Areal Surface Measurement Technology for Production and Research Environments
At the SPIE Photonics West 2023 Exhibition, Bruker Corporation today announced the release of two new white-light interferometry (WLI) systems: the ContourX-1000 and NPFLEX-1000 optical profilometers.
United states
Louis castel
Don cohen
Samuel lesko
Bruker nano surfacesfeb
Bruker corporation
From bruker nano surfacesfeb
Advanced find surface
Senior director
General manager
Optical metrology
Image credit
Bruker nano
Universal scanning interferometry
Contour X - 500 3D Optical Profilometer : Quote, RFQ, Price and Buy
This product profile outlines the features and benefits of the Contour X - 500 3D Optical Profilometer.
Bruker daltonics
Bruker scientific
Unmatched benchtop
Universal scanning interferometry
Multiple region
Independent metrology
Contourx 500 3d optical profilometer
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