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CALM Announces New Director of Human Resources | Business

Optical 3D Surface Profilers Market Analysis and Future Prospects for 2030

Automated In-Situ Nanoindentation with Hysitron PI 89 Auto SEM : Quote, RFQ, Price and Buy

Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.

Hysitron PI 89 SEM PicoIndenter—Advanced Versatility for Testing in Extreme Environments : Quote, RFQ, Price and Buy

Discover Bruer’s Hysitron PI 89 SEM PicoIndenter a state-of-the-art PicoIndenter for quantitative in-situ nanomechanics.

Characterizing Microlenses via White Light Interferometry

Because of their ever-increasing use in a variety of applications, microlenses and their design are constantly being improved to reduce distortion, astigmatism, or other problems that can impede observation. In this article, Bruker explains how white light interferometry can be used to characterize microlenses.

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