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Characterizing Microlenses via White Light Interferometry

Because of their ever-increasing use in a variety of applications, microlenses and their design are constantly being improved to reduce distortion, astigmatism, or other problems that can impede observation. In this article, Bruker explains how white light interferometry can be used to characterize microlenses. ....

Roger Posusta , Bruker Surevision , Louis Castel , Bruker Nano , Bruker Nano Surfaces , Tip Tilt , Multiple Region , Image Credit , Zernike Generation , Subtract Asphere , Samuel Lesko , White Light Interferometry ,

Who Is Shaping The Direction Of Metrology

Who Is Shaping The Direction Of Metrology
photonicsonline.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from photonicsonline.com Daily Mail and Mail on Sunday newspapers.

Samuel Lesko , Us Chips Rd Metrology Program , Semiconductor Engineering , International Bureau Of Weights , Semiconductor Ecosystem , International Organization Of Legal Metrology , National Institute Of Standards , International Cooperation , John Oncea , Science Act , Bruker Nano Surfaces , National Institute , Development Support , International Bureau , International Organization , Legal Metrology ,

Bruker Introduces Next-Generation 3D Areal Surface Measurement Technology for Production and Research Environments

At the SPIE Photonics West 2023 Exhibition, Bruker Corporation today announced the release of two new white-light interferometry (WLI) systems: the ContourX-1000 and NPFLEX-1000 optical profilometers. ....

United States , Louis Castel , Don Cohen , Samuel Lesko , Bruker Nano Surfacesfeb , Bruker Corporation , From Bruker Nano Surfacesfeb , Advanced Find Surface , Senior Director , General Manager , Optical Metrology , Image Credit , Bruker Nano , Universal Scanning Interferometry ,

Quality Control in Surface Metrology Through Software Integration

In this article, Digital Surf discusses how their partnership with Bruker has led to the development of a fully integrated surface metrology quality control analysis solution. ....

Alex Smith , Samuel Lesko , Software Analysis , Digital Surfjun , Surface Metrology Through Software , Image Credit , Challenges Associated , Statistical Process Control , Measurement Automation , Digital Surf , Surface Metrology , Quality Control ,

Using Optical Profiling to Optimize Finishing Steps in Additive Manufacturing | Webinars

Using Optical Profiling to Optimize Finishing Steps in Additive Manufacturing | Webinars
photonics.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from photonics.com Daily Mail and Mail on Sunday newspapers.

France General , Samuel Lesko , University Of Burgundy , Using Optical Profiling , Optimize Finishing Steps , Additive Manufacturingwed ,