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Characterizing Microlenses via White Light Interferometry

Because of their ever-increasing use in a variety of applications, microlenses and their design are constantly being improved to reduce distortion, astigmatism, or other problems that can impede observation. In this article, Bruker explains how white light interferometry can be used to characterize microlenses. ....

Roger Posusta , Bruker Surevision , Louis Castel , Bruker Nano , Bruker Nano Surfaces , Tip Tilt , Multiple Region , Image Credit , Zernike Generation , Subtract Asphere , Samuel Lesko , White Light Interferometry ,