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Spirox and Southport announce SiC defect tool

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Paul yangStacking fault

Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output; Targeting the Compound Semiconductor Market

/PRNewswire/ Professional semiconductor solution provider Spirox Corporation (TWSE: 3055) in collaboration with its subsidiary, Southport Corporation, has.

Hao chung kuoJay wangKen taiPaul yangSouthport corporationMaterial inspection laboratorySpirox corporationStacking faultChair professorOptoelectronic engineeringAdvanced opto material inspection laboratoryToray engineering

Spirox Corporation: Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output

Spirox Corporation: Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output
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Paul yangJay wangKen taiStefan klotterHao chung kuoTaiwan photonics industry technology development associationSemiconductor marketSouthport corporationPrnewswire spirox corporationCompound semiconductorStacking faultChair professorOptoelectronic engineeringTaiwan photonics industryTechnology development associationLassen sie
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