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Spirox and Southport launch first non-destructive SiC defect inspection system

Non-linear optical technology replaces destructive potassium hydroxide etching detection method

Paul yangJay wangKen taiHao chung kuoMaterial inspection laboratorySouthport corpDepartment of optoelectronic engineering at taiwanTechnology development associationSpirox corpOptoelectronic engineeringAdvanced opto material inspection laboratory

Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output; Targeting the Compound Semiconductor Market

/PRNewswire/ Professional semiconductor solution provider Spirox Corporation (TWSE: 3055) in collaboration with its subsidiary, Southport Corporation, has.

Hao chung kuoJay wangKen taiPaul yangSouthport corporationMaterial inspection laboratorySpirox corporationStacking faultChair professorOptoelectronic engineeringAdvanced opto material inspection laboratoryToray engineering

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