The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it the method of choice when studying surface structures and dynamic surface processes.
X-ray photoelectron spectroscopy (XPS) is a spectroscopic technique for measuring the elemental composition of a sample. In this article, we discuss its use in nanotechnology research.
Owing to the absence of moving mechanical components, dual-comb spectroscopy (DCS) can attain greater spectrum sensitivity and a low acquisition duration (in contrast to Fourier-transform spectroscopy).
Owing to the absence of moving mechanical components, dual-comb spectroscopy (DCS) can attain greater spectrum sensitivity and a low acquisition duration (when contrasted to Fourier-transform spectroscopy).