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For the first time, a team of researchers at the Technical University of Munich (TUM) has integrated the dark-field X-ray method into a CT scanner

Nikolai gustschinClemens schmidThomas koehlerFrank bergnerPascal meyerManuel viermetzTobias lasserFranz pfeifferJakob haeuseleRoland proksaTechnical university of munichMunich institute of biomedical engineeringTechnical universityBiomedical physicsMunich instituteBiomedical engineering