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New technology for clinical CT scans
For the first time, a team of researchers at the Technical University of Munich (TUM) has integrated the dark-field X-ray method into a CT scanner
Munich
Bayern
Germany
Nikolai-gustschin
Clemens-schmid
Thomas-koehler
Frank-bergner
Pascal-meyer
Manuel-viermetz
Tobias-lasser
Franz-pfeiffer
Jakob-haeusele
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