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Characterization of Novel Data Storage Solutions

Explore the characterization of novel date solutions with AFM and EDS.

United statesTyndall national institute in corkInternational data corporation white paperOxford instruments companyOxford instruments asylum researchJournal of the american ceramic societyAsylum researchOxford instruments companyfebTyndall national instituteImage creditOxford instrumentsApplied physicsWorld from edgeMagnetic field induced ferroelectric switchingMultiferroic aurivillius phase thin filmsAmerican ceramic society

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