This article explores the significant advancements in transistor technology through the integration of silicon-doped hafnium oxide, highlighting its role in improving energy efficiency and performance in modern computing devices.
This article explores the pioneering work of Dr. Laura Fumagalli and her team in using advanced
Scanning Dielectric Microscopy to investigate the electric polarization properties of nanomaterials like
2D crystals and biomolecules.
Oxford Instruments Asylum Research today announces the release of its new atomic force microscope (AFM) package developed for battery research, the Cypher ES Battery Edition.
Oxford Instruments Asylum Research announces today the release of Vero, the first and only AFM with Quadrature Phase Differential Interferometry (QPDI) cantilever sensing technology.
Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter XR atomic force microscope (AFM).