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Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
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Aehr Test : Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs -April 02, 2024 at 05:13 am EDT

Aehr Test Systems , a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer order for a FOX-NP™ wafer level test and burn-in system,.

United statesJim byersVernon rogersGayn ericksonWaferpaktmand diepakWilliam blairSecurities exchangeExchange commissionInvestor relations incTest systemsPak alignerBipolar voltage channel moduleVery high voltage channel moduleAehr test systemsAutomated waferpakWaferpak contactors

Aehr Test Systems: Aehr Receives Order from New Customer for FOX-NP Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

Aehr Test Systems: Aehr Receives Order from New Customer for FOX-NP Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
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Aehr Test Systems to Announce Third Quarter Fiscal 2024 Financial Results

Aehr Test Systems to Announce Third Quarter Fiscal 2024 Financial Results
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Aehr Test Systems to Announce Third Quarter Fiscal 2024 Financial Results on April 9, 2024

Aehr Test Systems to Announce Third Quarter Fiscal 2024 Financial Results on April 9, 2024
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