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Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
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Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
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United statesJim byersWilliam blairGayn ericksonVernon rogersInvestor relations incSecurities exchangeExchange commissionAehr test systemsPak alignerBipolar voltage channel moduleVery high voltage channel moduleAutomated waferpakWaferpak contactorsAehr testPak contactor

Aehr Test : Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs -April 02, 2024 at 05:13 am EDT

Aehr Test Systems , a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer order for a FOX-NP™ wafer level test and burn-in system,.

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Aehr Test Systems: Aehr Receives Order from New Customer for FOX-NP Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

Aehr Test Systems: Aehr Receives Order from New Customer for FOX-NP Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs
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Aehr Test Systems: Aehr Announces Shipment of New High-Power Configured FOX-XP System for Wafer Level Burn-in and Stabilization of Next Generation Silicon Photonics Integrated Circuits

Aehr Test Systems: Aehr Announces Shipment of New High-Power Configured FOX-XP System for Wafer Level Burn-in and Stabilization of Next Generation Silicon Photonics Integrated Circuits
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