Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the underlying layers.
Researchers at The University of Texas at Arlington have created a brand-new method for measuring the properties of the topmost atomic layer of materials without taking into account data from the deeper layers.
Advances in spectroscopy miragenews.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from miragenews.com Daily Mail and Mail on Sunday newspapers.
Physicists find new way to measure properties of material s surface layer miragenews.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from miragenews.com Daily Mail and Mail on Sunday newspapers.