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Physicists Find New Way to Measure Properties of a Material s Surface Layer
Physicists at The University of Texas at Arlington have developed a new technique that can measure the properties of the topmost atomic layer of materials without including information from the underlying layers.
United states
Varghese chirayath
Alex weiss
Megan craig
Alex fairchild
Bernardo barbiellini
Saurabh mukherjee
Ali koymen
Randall gladen
Department of physics
National science foundation
Positron lab
Welch foundation
University of texas at arlington
Auger mediated positron sticking
Physical review letters
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