Zinc oxide or ZnO group semiconductors, which are comprised of ZnO and several ternary or even quaternary semiconductors created by adding appropriate additional elements to zinc and oxygen, are potentially suitable for UV-emitting solid-state technologies.
AFM is a strong technique for analyzing thin films and coatings, and it may provide useful information that is crucial to the performance of a material or process. AFM assesses nanoscale functionalities, including electrical, magnetic, and mechanical characteristics, by quantifying 3D roughness and