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HELIX Spectral Analysis System - Measuring High-Performance Optical Filters

HELIX™ Spectral Analysis System accurately measures the highest-performance optical filters.
The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations of most commercially available spectrophotometers. The system’s capabilities are four-fold: it is able to track filter edges to OD7 (-70 dB), evaluate blocking to OD9 (-90 dB), resolve edges as steep as 0.4% relative to edge wavelength from 90% transmission to OD7, and resolve passbands that are as narrow as 0.1 nm at full width half maximum (FWHM).
Figure 1. Transmission spectra of a high-cavity-count ultra-narrow bandpass filter measured with the HELIX System and compared to theory. The HELIX System is able to measure blocking up to a level of OD9 (-90 dB). ....

Amber Czajkowski , Niels Cooper , Peter Egerton , Mike Scobey , Alannah Johansen , Alluxa Inc , Rance Fortenberry , Spectral Analysis System , Analysis System , Alluxa Engineering , Measurement Techniques , Rear Beam Attenuation , Ultra Narrow Bandpass , Thin Film Interference Filters , White Paper , Flat Top , Alluxa White Paper , Optical Filters , Optical Filter , Ultra Narrow , Bandpass Optical Filters , Ultra Narrow Bandpass Optical Filters , நியீல்ஸ் கூப்பர் , பீட்டர் எகர்‌டந் , மைக் ஸ்கோபி , அலன்னா ஜோஹன்சன் ,

02.24.21 -- Beam Pen Lithography | Illuminating Light-Based Dx Medtech

02.24.21 Beam Pen Lithography | Illuminating Light-Based Dx Medtech

Article
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By Ralf Daferner,
SCHOTT North America Inc.
COVID-19 and other pandemics increase the need for light-based medical instruments, such as airway endoscopes and in vitro diagnostic devices, while also bringing a wave of innovation in these areas.
Product Focus
Zygo’s Nexview LS650 is a large format metrology system designed as an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels, and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D and 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. ....

Ophir Photonics , Alannah Johansen , Application Note Raptor Photonics , Research Science , Alluxa Inc , Systems Inc , Physik Instrumente , Raptor Photonics , Analysis System , Opto Diode , ஓபிர் ஃபோட்டானிக்ஸ் , அலன்னா ஜோஹன்சன் , விண்ணப்பம் குறிப்பு ர்யாப்‌டர் ஃபோட்டானிக்ஸ் , ஆராய்ச்சி அறிவியல் , அமைப்புகள் இன்க் , ர்யாப்‌டர் ஃபோட்டானிக்ஸ் , பகுப்பாய்வு அமைப்பு , ஒப்தொ டையோடு ,

12.23.20 -- Measuring Wide Divergent Beams | Raman Spectroscopy + a BI sCMOS Camera

12.23.20 Measuring Wide Divergent Beams | Raman Spectroscopy + a BI sCMOS Camera

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By Altaf Ramji, PCO-TECH, Inc. and Evan Eshelman, Impossible Sensing
Operating in a climate-controlled lab or on the Martian surface, back-illuminated sCMOS detectors provide high sensitivity, high dynamic range, and low noise, even in low-light conditions.
Application Note
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By Yoni Groisman, Karol Sanilevitch, Roei Yiftah, Dr. Simon Rankel,
Ophir Photonics
Wide, divergent beams place specific requirements on a measurement system. The apertures of conventional beam profilers are too small to collect the entire spot of large or divergent light sources, while diverging beams cannot be accurately measured with ....

United States , Xiaolun Zeng , Michelle Derouin , Alannah Johansen , Optics Inc , Research Science , Alluxa Inc , Article Laser Components United States Inc , Systems Inc , Application Note , Laser Components United States , Iridian Spectral , Gentec Electro Optics , ஒன்றுபட்டது மாநிலங்களில் , மைக்கேல் தேரோவின் , அலன்னா ஜோஹன்சன் , ஒளியியல் இன்க் , ஆராய்ச்சி அறிவியல் , கட்டுரை லேசர் கூறுகள் ஒன்றுபட்டது மாநிலங்களில் இன்க் , அமைப்புகள் இன்க் , விண்ணப்பம் குறிப்பு , லேசர் கூறுகள் ஒன்றுபட்டது மாநிலங்களில் ,