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Aehr Test : Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs -April 02, 2024 at 05:13 am EDT

Aehr Test Systems , a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer order for a FOX-NP™ wafer level test and burn-in system,. ....

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