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JEOL Introduces New FIB-SEM

From JEOL USA, Inc. Feb 2 2023 JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). ....

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Leveraging LPGC and Short Collision Cell Technology

From JEOL USA, Inc. Feb 24 2022 Peabody, MA – JEOL USA, Inc, a leader in the mass spectrometry space for over 60 years, is once again leading the way in laboratory innovation. ....

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JEOL Introduces New Configuration of Its Broad Ion Beam Milling Cross Section

JEOL Introduces New Configuration of Its Broad Ion Beam Milling Cross Section
JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high-resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation (down to LN2 temperature), and air-isolated transfer for atmosphere-sensitive specimens (for example Li batteries).
Traditional mechanical preparation of specimen surfaces for SEM imaging can introduce various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information, and precise layer thickness measurements. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. The JEOL CP is a tabletop i ....

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JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF™ GC-Alpha

JEOL Introduces New Time-of-Flight Mass Spectrometer JMS-T2000GC AccuTOF™ GC-Alpha
JEOL builds upon its legacy of successful AccuTOFTM GC series gas chromatograph – time-of-flight mass spectrometers with the release of the JMS-T2000GC AccuTOF™ GC-Alpha . This product is a GC-MS that represents a significant improvement in performance and functionality using two newly developed key technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration.
High-Performance Hardware
The JMS-T2000GC “AccuTOF™ GC-Alpha”, the 6th generation of the successful AccuTOF™ GC series, features new high-performance hardware that achieves three times the mass resolving power and mass measurement accuracy of the previous “AccuTOF™ GCx-plus” by using a whole new ion optics design that achieves excellent sensitivity and high data acquisition speed, the long-time hallmark ....

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TESCAN Announces their New Nanomanipulator for Lift-Out and Manipulation Applications Performed in TESCAN SEM and FIB-SEM Instruments

From TESCAN USA Inc. ....

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