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Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
streetinsider.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from streetinsider.com Daily Mail and Mail on Sunday newspapers.

Toshimichi Iwai , Advantest Corporationadvantest , Usacassandra Koenig , Advantest America Inc , Nanotechnology Business Group , Advantest Corporation , Review Scanning Electron Microscope , Fully Automatic Image , Mask Inspection , Tokyo Big , Roadsan Jose , Advantest America ,

Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
streetinsider.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from streetinsider.com Daily Mail and Mail on Sunday newspapers.

United States , Toshimichi Iwai , Cassandra Koenig , Nanotechnology Business Group , Advantest Corporation , Review Scanning Electron Microscope , Fully Automatic Image , Mask Inspection , Tokyo Big ,

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

TOKYO, Dec. 01, 2022 (GLOBE NEWSWIRE) Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM), its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to… ....

Toshimichi Iwai , Nanotechnology Business Group , Advantest Corporation , Review Scanning Electron Microscope , Fully Automatic Image , Mask Inspection , Tokyo Big ,

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
streetinsider.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from streetinsider.com Daily Mail and Mail on Sunday newspapers.

Toshimichi Iwai , Advantest Corporationadvantest , Usacassandra Koenig , Advantest America Inc , Nanotechnology Business Group , Advantest Corporation , Review Scanning Electron Microscope , Fully Automatic Image , Mask Inspection , Tokyo Big , Roadsan Jose , Advantest America ,