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Radio Architecture Matters: A Review of RF Sampling vs. Zero-IF

Radio Architecture Matters: A Review of RF Sampling vs. Zero-IF
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Nikhil Menon , Walt Kester , Ashkan Mashhour , Brad Brannon , Norman Beamish , Ankit Gupta , Jonathan Harris , Dither Analog Devices Inc , Test Results Analog Devices Inc , Jitter Analog Devices Inc , Abcs Of Interleaved Adcs Analog Devices Inc , Growing Challenge , New Wireless , Trade Offs Between , William Domino , Direct Conversion Receiver , Sampled Systems , Clock Phase Noise , Nyquist Criterion Means , Sampled Data System Design , Kenny Man , Wide Area Receiver Analysis , Test Results , Overcoming Converter Nonlinearities ,

Evertiq - AC and DC Data Acquisition Signal Chains Made Easy

AC and DC Data Acquisition Signal Chains Made Easy
Sampling phenomena in analog-to-digital converters (ADCs) induce the problems of aliasing and capacitive kickback, and to solve these problems, designers use filters and driving amplifiers that introduce their own sets of challenges.
This makes achieving precision dc and ac performance in medium bandwidth application areas a challenge and designers end up trading off system goals to do so.
This article describes continuous-time sigma-delta(∑-Δ) ADCs that inherently and dramatically solve the sampling problems by simplifying signal chains. They remove the need for antialiasing filters and buffers, and solve signal chain offset errors and drift issues associated with the additional components. These benefits shrink the solution size, ease solution design, and improve the phase matching and overall latency of the system. ....

Roberto Maurino , Abhilasha Kawle , Gaborc Temes , Wasim Shaikh , Srikanth Nittala , John Wiley , Analog Devices , Pune University , Indian Institute Of Technology , Precision Converters Department , Fundamentals Digitization , Combating Challenges , Precision Performance For , Switched Capacitor Input , Continuous Time Sigma Delta , Inherent Antialiasing Moving , Resistive Input Having , Signal Chain Benefits , Free Inherent , Excellent Phase Matching Having , Interference Because , Resistive Inputs With , Design The , Size Removal , Nyquist Criterion Means , Sampled Data System Design ,