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Touch Controller Update: DATA MODUL Presents mXT2952TD Controller Board


Munich, 23
rd of April 2021
Introducing the mXT2952TD touch controller board, the latest innovation from DATA MODUL. Designed for PCAP touch applications in the medium diagonal segment, this controller board offers features that optimize its use in a variety of environments.
The new controller board supports the latest generation of microchip touch ICs and features a new type of signal acquisition method, the differential mutual sensing, which significantly increases the signal-to-noise ratio (SNR) and enables superb touch behavior, even under difficult environmental conditions.
The high SNR makes applications with thicker gloves and thicker cover lenses possible and is crucial for passing electromagnetic compatibility tests according to standard EN61000-4-6 (immunity to conducted disturbances, induced by radio-frequency fields). Even at noise levels of 10V/m and higher, the mXT2952TD controller board can comply with evaluation criterion A (no impairment of the fu ....

Robert Meier , Product Management Industrial Division , ராபர்ட் மையர் ,

Touch controlled for mid-sized industrial displays


Touch controlled for mid-sized industrial displays
Data Modul is aiming at industrial displays from 12.1 to 23.8in with a projected capacitive (PCap) touch controller PCB built around Microchip’s TD series of touch controller chips.
The mXT2952TD touch controller board is compatible with Data Module’s earlier mXT2952T2, but includes differential mutual sensing to increase signal-to-noise ratio.
“Neither thick gloves up to 5mm nor cover glasses up to 10mm affects the multi-touch recognition of the new controller board,” according to the company. “The high signal-to-noise ratio is also crucial for passing electromagnetic compatibility tests according to EN61000-4-6 immunity to conducted disturbances, induced by radio-frequency fields. Even at noise of 10V/m and higher, the mXT2952TD controller board can comply with evaluation criterion A – no impairment of the function during and after the test. ” ....

Robert Meier , Data Module , Data Modul , ராபர்ட் மையர் , தகவல்கள் தொகுதி ,