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 E-Mail IMAGE: Graphene Flagship researchers have developed a new measurement standard for the analysis of graphene and layered materials that could accelerate production and optimise device fabrication. view more  Credit: Graphene Flagship X-ray scans revolutionised medical treatments by allowing us to see inside humans without surgery. Similarly, terahertz spectroscopy penetrates graphene films allowing scientists to make detailed maps of their electrical quality, without damaging or contaminating the material. The Graphene Flagship brought together researchers from academia and industry to develop and mature this analytical technique, and now a novel measurement tool for graphene characterisation is ready. The effort was possible thanks to the collaborative environment enabled by the Graphene Flagship European consortium, with participation by scientists from Graphene Flagship partners DTU, Denmark, IIT, Italy, Aalto University, Finland, AIXTRON, UK, imec, Belgium

United kingdomThurid gspannMarco romagnoliPeter jepsenAndreac ferrariAmaia zurutuzaAalto universityManagement panelWarsaw universityGraphene flagship standardisation committeeGraphene flagship division leader for electronicsGraphene flagshipGraphene flagship europeanGraphene flagship standardisationGraphene flagship partnerScientific director