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The Role of Oxygen Impurities in Semiconductor Properties
A surprising new source of conductivity from oxygen atoms trapped inside has been noted by a research group probing the properties of a semiconductor integrated with a novel thin oxide film.
United states
Quardia shutterstock
Tien lin lee
Peter sushko
Judith gabel
Joe ngai
Zihua zhu
Bethany matthews
Mark bowden
Steven spurgeon
Department of energy
Pacific northwest national laboratory
Environmental molecular sciences laboratory
Radiochemical processing laboratory
American physical society
University of texas at arlington matt chrysler
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