This article explores how key optical methodologies are applied to inspection, metrology, and analysis at various stages of semiconductor research, development, and volume manufacturing.
Composite materials have revolutionized various industries, from aerospace to automotive, by offering lightweight, high-strength alternatives to traditional materials. However, characterizing and understanding their complex molecular structure presents challenges.
With advanced resolutions reaching sub-angstrom levels, electron microscopy provides direct visualizations of catalyst particles, support structures, and pores that complement spectroscopic and diffraction methods. When integrated with elemental analysis techniques, a comprehensive picture of catalytic systems can be built up from the microscopic level.
Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and performance under simulated water treatment conditions. These unique capabilities make AFM instrumental in understanding and optimizing the membranes and barriers central to water purification technologies.