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STAr Technologies unveils 3D/2.5D MEMS micro-cantilever WAT probe card

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is designed and delivered for nanometer technology node process with extent performance beyond any known solutions in the test industry market. ....

Choon Leong Lou , Virgo Prima Series , News Coverage , Ews Highlights , Press Release , Probe Card , Ostar Technologies ,