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SLM PVT Monitoring IP | Synopsys

SLM PVT Monitoring IP | Synopsys
synopsys.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from synopsys.com Daily Mail and Mail on Sunday newspapers.

Silicon assessment health monitoringAnalog ip selector foundation nonPin datasheet release notes docPin datasheet docSynopsys incSilicon lifecycle managementInstruction set architectureReal time analysisSilicon assessmentHealth monitoringCatastrophic trip sensorSubscribe catastrophic trip sensorSubscribe distributed thermal sensorNon deepSubscribe process detectorController subsystem

SLM PVT Monitoring IP | Synopsys

SLM PVT Monitoring IP | Synopsys
synopsys.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from synopsys.com Daily Mail and Mail on Sunday newspapers.

Pin datasheet docSilicon assessment health monitoringAnalog ip selector foundation nonSynopsys incPin datasheet release notes docSilicon lifecycle managementInstruction set architectureReal time analysisSilicon assessmentHealth monitoringCatastrophic trip sensorSubscribe catastrophic trip sensorSubscribe distributed thermal sensorNon deepSubscribe process detectorController subsystem

SLM PVT Monitoring IP | Synopsys

SLM PVT Monitoring IP | Synopsys
synopsys.com - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from synopsys.com Daily Mail and Mail on Sunday newspapers.

Analog ip selector foundation nonSilicon assessment health monitoringSynopsys incSilicon lifecycle managementInstruction set architectureReal time analysisSilicon assessmentHealth monitoringCatastrophic trip sensorSubscribe catastrophic trip sensorSubscribe distributed thermal sensorNon deepSubscribe process detectorController subsystemSubscribe thermal diodeBase pin

SLM PVT Monitoring IP | Synopsys

The In-Chip Monitoring Subsystem from Synopsys (using formerly Moortec technology) allows for a greater understanding of device fabrication, process variability and in-field dynamically changing conditions.

Synopsys incAnalog ip selector foundation nonSilicon assessment health monitoringSilicon lifecycle managementInstruction set architectureReal time analysisSilicon assessmentHealth monitoringCatastrophic trip sensorSubscribe catastrophic trip sensorSubscribe distributed thermal sensorNon deepSubscribe process detectorController subsystemSubscribe thermal diodeBase pin

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