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Oxford Instruments Asylum Research releases fast force mapping (FFM) nanomechanical mode on Jupiter XR, large sample atomic force microscope
Product News: Oxford Instruments Asylum Research releases fast force mapping (FFM) nanomechanical mode on Jupiter XR, large sample atomic force microscope
07 May 2021
Oxford Instruments Asylum Research is pleased to announce the release of fast force mapping (FFM) mode for the Jupiter XR atomic force microscope (AFM). The FFM mode enables users to image sample topography and simultaneously acquire nanomechanical information such as elasticity, adhesion, and hardness. Additionally, when used in conjunction with the conductive AFM probe holder, sample conductivity can also be characterized.