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Using Atomic Force Microscopy to Look at Thin Ice : comparem
Using Atomic Force Microscopy to Look at Thin Ice : comparem
Using Atomic Force Microscopy to Look at Thin Ice
Images of two-dimensional ice captured using atomic force microscopy (AFM) demonstrate a previously unseen growth mechanism.
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Daniel Bonn ,
Stefania Ketzetzi ,
Bart Weber ,
Fujie Tang ,
Ilamaran Sivarajah ,
Ellen Hg Backus ,
Franzj Giessibl ,
Ilamaran Sivarajahapr ,
Huibj Bakker ,
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Yuki Nagata ,
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Studying Thin Ice ,
Mischa Bonn ,
Molecular Insight ,
Physical Chemistry Letters ,
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