What is Particle Measuring? The process of sizing and counting particulates in a sample is called particle measuring and can be performed in either liquid or air. Industrial processes such as semiconductor wafer fabrication use this technique prominently. These processes have a requirement of high fluidic purity and are especially concerned with the presence of particulate contaminants as they can lead to system damage or product waste. The Challenge Particle measurement is used in semiconductor wafer fabrication processes to ensure that cleaning, cooling, and chemical fluids are contaminant-free. The space required and size of the equipment needing for performing this analysis has started to become an issue for industries like these as they begin to leverage the power of particle measuring against contamination.