Sponsored by CSInstrumentsNov 17 2020
Concept Scientific Instruments has successfully developed Soft Intermittent Contact mode (or Soft IC) - an alternative measurement mode that offers the key benefits of contact mode and force spectroscopy, while addressing the intrinsic slowness and friction forces commonly associated with these techniques.
Soft IC can be employed within a wide range of applications including electrical characterization, material characterization, polymer science, biology applications, investigating semiconductors and work with soft samples.
PDMS – Soft IC mode – 20µm. Topography (left) & Stiffness (right). Video Credit: CSInstruments
Principles of Soft IC
A Soft IC workflow is displayed in Figure 2. The process begins with the tip being moved to a safe distance (referred to as ‘lift height’) from the surface before being rapidly moved to the next measurement point. Once there, the tip performs a force spectroscopy curve.
The Galaxy Dual Controller for AFM
Image Credit: CSInstruments
The GALAXY DUAL USB controller adds an array of new features to those commonly available on an existing AFM, creating exciting new opportunities for AFM users. This new controller gives new life to any AFM, improving its performance via intuitive software and new imaging modes.
The GALAXY DUAL controller offers genuine integrated lock-in, ensuring improved measurement capability including, phase detection and field measurement. The instrument is fitted with low-noise electronics while its power supply is coupled to 24-bit drive architecture, delivering smart integration and high resolution.
Compatible with Existing AFM Modes