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Synopsys Tapes Out SLM PVT Monitor IP on TSMC N5 and N3E Processes

At advanced nodes, in particular, there are greater process, voltage, and temperature (PVT) challenges to overcome when developing complex chips, whether .

Demanding Chip Complexity and Manufacturing Requirements Call for Data Analytics

The complexity of the silicon manufacturing processes has led to an explosion of data. Traditionally, engineering teams have had access to data pertaining .

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