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Atomic Force Microscopy-based Nanoindentation: An Overview
AFM nanoindentation has application in surface height topology mapping and 3D high-resolution imaging, notably in facilitating in situ quantification of the residual indents’ shape.
Gorodenkoff shutterstock
Parva chhantyal
Beilsteinj nanotechnol
Atomic force microscopy
Nanoindentation to quantify mechanical properties of nano
Journal of materials research
Force microscopy
Veeco dimension
Measurement science
Metal organic framework
Vibrational modes
Terahertz physical phenomena underpinning
Micron sized crystals
Organic framework
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