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Enhancing Chip Yield Through Machine-Learning-Driven Test Analytics Technology

What if you could determine that your semiconductor wafer has problematic dies while it’s being tested, rather than having to wait until the process .

Real-Time Data Infrastructure Platform Advances Semiconductor Test

Real-Time Data Infrastructure Platform Advances Semiconductor Test
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Advantest Launches Real-Time Data Infrastructure (RTDI™)

Advantest Launches Real-Time Data Infrastructure (RTDI™)
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Data Analytics Becomes Staple of New EDA Tools

AI and machine learning algorithms enabling EDA software to become rich data repository to give engineers greater insight into cause of design errors.

New Synopsys Big Data Analytics Tools To Fuel Chipmakers With AI-Driven Insights

Synopsys EDA Data Analytics (.da) leverages AI-driven analytics to accelerate root-cause analysis and otherwise drive more intelligent decision-making throughout the IC design, test, and manufacturing lifecycle.

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