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Automation for Sustained Quality in TEM Sample Preparation

This article explores how automation can be utilized to increase throughput and establish reproducible and sustained quality for TEM sample preparation.

United statesAimee molineuxUnited states incTescan united states incUnited states inc aprStates inc aprDark fieldImage creditTescan united statesTem sample preparation

Preventing Sample Surface Damage Through Plasma FIB-SEM Large Area Polishing

This article explores how sample surface damage can be reduced using Plasma FIB-SEM low angle large area polishing.

United statesAimee molineuxUnited states inc aprTescan united states incUnited states incStates inc aprElectron backscatter diffractionAngle polishingLow angle polishingOxford instrumentsImage creditTescan united statesPlasma fib sem

University of Pau Installs First Ever Spectral CT Analytical Composition Capability

Hannelore Derluyn, CNRS associate scientist, Pascale Sénéchal, research engineer at the DMEX Center for X-ray Imaging. Image Credit: TESCAN

Czech republicUnited statesFrance generalHannelore derluynAimee molineuxPau peter moonenUnited states inc aprUniversity of pauPau universityStates inc aprX ray imagingImage creditWesley de boeverUni pauPeter moonen

NuNano Installs and Automates TESCAN FESEM for High-Precision Quality Control

NuNano Installs and Automates TESCAN FESEM for High-Precision Quality Control
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United statesNunano bristolRay coddJames vicaryUniversity of bristol department computer scienceBristol science innovation centreUnited states inc aprUniversity of bristolNunano ltdKingdom ltdResearch englandStates inc aprEmission scanning electron microscopeComputer scienceManaging directorGeneral manager