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Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production

Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS). The new module, the H3DM-XL, is at the heart of the latest addition to Hprobe’s IBEX line, the IBEX-WS. The IBEX-WS test equipment integrates 3D magnetic field…

San franciscoUnited statesSiamak salimyMagnetics societyAutomatic test equipmentField calibration unitHigh volume manufacturingFirst customer shipmentSpin transfer torqueSpin orbit torqueWafer acceptance test

Breakthrough in testing for advanced 3D magnetic sensors

Breakthrough in testing for advanced 3D magnetic sensors
newelectronics.co.uk - get the latest breaking news, showbiz & celebrity photos, sport news & rumours, viral videos and top stories from newelectronics.co.uk Daily Mail and Mail on Sunday newspapers.

Siamak salimyAutomated test equipmentதானியங்கி சோதனை உபகரணங்கள்

Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors

Hprobe Announces Breakthrough in High-Volume Testing for Automotive/Consumer Advanced 3D Magnetic Sensors
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Kostenloser wertpapierhandelSiamak salimyCamille dufourInternational pr consultingAutomated test equipmentகாமில் துபௌூர்சர்வதேச ப்ர் ஆலோசனைதானியங்கி சோதனை உபகரணங்கள்