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Powerful new semiconductor tool introduced by park systems

The first fully integrated system that combines atomic force microscopy with white light interferometer profilometry

Ryan yooStefan kaemmerBusiness developmentProduct newsSpark systemsGeneral managerPowerful new semiconductor tool introduced by park systems combines atomic force microscopy with white light interferometryAtomic force microscopyWhite light interferometerQuality assurance

Park Systems announces Park FX40

Park Systems announces Park FX40
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Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence? A Groundbreaking New Class of Atomic Force Microscope

Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence? A Groundbreaking New Class of Atomic Force Microscope
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Park Systems Announces Park FX40

Park Systems Announces Park FX40
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United statesRyan yooAtomic force microscopeProduct developmentColumbia universityAtomic force microscopesFrom park systemsjunForce microscopeVice president productForce microscopesNorth americaJames honeMechanical engineeringஒன்றுபட்டது மாநிலங்களில்ரியான் யூஅணு படை நுண்ணோக்கி