System-level testing demand for advanced ICs has been rising. Foundries including TSMC, Intel and Samsung Electronics, as well as OSATs such as ASE Technology, are already involved, according to industry sources.
Semiconductor testing service providers have seen clients start replenishing inventory for display driver ICs (DDI) and PC peripheral chips, according to industry sources.
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is designed and delivered for nanometer technology node process with extent performance beyond any known solutions in the test industry market.
WinWay Technology, a provider of IC test interface solutions, remains focused on high-performance computing (HPC) chip demand and has rolled out wafer-level co-packaged optics (CPO) solutions jointly developed with customers.
HSINCHU, Taiwan, Dec. 12, 2022 /PRNewswire/ MPI Corporation's Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended