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HELIX™ Spectral Analysis System accurately measures the highest-performance optical filters. The HELIX Spectral Analysis System has redefined measurement capabilities of high performance thin-film optical filters. HELIX is an instrument designed and developed by Alluxa Engineering staff to address the limitations of most commercially available spectrophotometers. The system’s capabilities are four-fold: it is able to track filter edges to OD7 (-70 dB), evaluate blocking to OD9 (-90 dB), resolve edges as steep as 0.4% relative to edge wavelength from 90% transmission to OD7, and resolve passbands that are as narrow as 0.1 nm at full width half maximum (FWHM). Figure 1. Transmission spectra of a high-cavity-count ultra-narrow bandpass filter measured with the HELIX System and compared to theory. The HELIX System is able to measure blocking up to a level of OD9 (-90 dB).

Amber czajkowskiNiels cooperPeter egertonMike scobeyAlannah johansenAlluxa incRance fortenberrySpectral analysis systemAnalysis systemAlluxa engineeringMeasurement techniquesRear beam attenuationUltra narrow bandpassThin film interference filtersWhite paperFlat top