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A magnetic sector secondary ion mass spectrometry was integrated with a focused ion beam (FIB)–scanning electron microscopy (SEM) instruments for nanoscale investigations.

Bhavna kavetijulSusha cheriyedathFox shutterstockBhavna kavetiIon mass spectrometryFocused ionMagnetic sector secondary ion mass spectrometryNanoscale chemicalImage creditAnalytical chemistry