Quality control is a key aspect of electronics manufacturing. However, due to the increasing complexity combined with miniaturization of electronic components, the challenge is to detect defects that can affect the performance of products. This forces the development of more and more accurate inspection methods and accompanying technologies to support the analysis of results. Non-destructive testing (NDT) is helpful, which allows you to conduct an inspection using X-ray radiation (X-ray) and computed tomography (CT) in a precise way. Both methods are successfully used in Comarch IoT Plant.