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Aug 12 2021 Reviewed by Joan Nugent High-angle annular dark-field scanning transmission electron microscopy can be used to determine complex conformational structures of both crystalline and amorphous.

Imaoka takaneJunko kakinumaKenji takadaTakane imaokaKen albrechtMari moritaJoan nugentKimihisa yamamotoInstitute of innovative researchTokyo institute of technology techTokyo institute of technologyTokyo instituteTokyo techProfessor kimihisa yamamotoAssociate professor takane imaokaAssociate professor